Effect of length and negative differential resistance behavior in conjugated molecular wire tetrathiafulvalene devices | |
Xiaojiao Zhang; Keqiu Chen; Mengqiu Long; Jun He; Yongli Gao | |
刊名 | Modern Physics Letters B |
2015 | |
卷号 | Vol.29 No.20页码:1550106 |
关键词 | Electronic transport property tetrathiafulvalene molecular length negative differential resistance |
ISSN号 | 0217-9849;1793-6640 |
URL标识 | 查看原文 |
公开日期 | [db:dc_date_available] |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/6092770 |
专题 | 湖南大学 |
作者单位 | 1.Cent S Univ, Sch Mat Sci & Engn, Changsha 410083, Hunan, Peoples R China 2.Hunan Univ, Dept Appl Phys, Changsha 410082, Hunan, Peoples R China 3.Cent S Univ, Sch Phys & Elect, Inst Super Microstruct & Ultrafast Proc Adv Mat, Changsha 410083, Hunan, Peoples R China |
推荐引用方式 GB/T 7714 | Xiaojiao Zhang,Keqiu Chen,Mengqiu Long,et al. Effect of length and negative differential resistance behavior in conjugated molecular wire tetrathiafulvalene devices[J]. Modern Physics Letters B,2015,Vol.29 No.20:1550106. |
APA | Xiaojiao Zhang,Keqiu Chen,Mengqiu Long,Jun He,&Yongli Gao.(2015).Effect of length and negative differential resistance behavior in conjugated molecular wire tetrathiafulvalene devices.Modern Physics Letters B,Vol.29 No.20,1550106. |
MLA | Xiaojiao Zhang,et al."Effect of length and negative differential resistance behavior in conjugated molecular wire tetrathiafulvalene devices".Modern Physics Letters B Vol.29 No.20(2015):1550106. |
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