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	Harzard-Based ATPG for Improving Delay Test Quality
	Liu, Tieqiao; Zhou, Yingbo; Liu, Yi; Cai, Shuo
刊名	Journal of Electronic Testing
	2015
卷号	Vol.31 No.1页码:27-34
关键词	Delay test Hazard-based detection Test generation
ISSN号	0923-8174
URL标识	查看原文
公开日期	[db:dc_date_available]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/6090525
专题	湖南大学
作者单位	1.College of management, Hangzhou Dianzi University, Hangzhou 2.310018, China 3.College of Information Science & Engineering, Hunan University, Changsha 4.410082, China
推荐引用方式 GB/T 7714	Liu, Tieqiao,Zhou, Yingbo,Liu, Yi,et al. Harzard-Based ATPG for Improving Delay Test Quality[J]. Journal of Electronic Testing,2015,Vol.31 No.1:27-34.
APA	Liu, Tieqiao,Zhou, Yingbo,Liu, Yi,&Cai, Shuo.(2015).Harzard-Based ATPG for Improving Delay Test Quality.Journal of Electronic Testing,Vol.31 No.1,27-34.
MLA	Liu, Tieqiao,et al."Harzard-Based ATPG for Improving Delay Test Quality".Journal of Electronic Testing Vol.31 No.1(2015):27-34.

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