QQ客服 官方微博 反馈留言

	Intelligent MRTD testing for thermal imaging system using ANN (EI CONFERENCE)
	Sun J. ; Ma D.
	2006
会议名称	ICO20: Remote Sensing and Infrared Devices and Systems, August 21, 2005 - August 26, 2005
会议地点	Changchun, China
关键词	The Minimum Resolvable Temperature Difference (MRTD) is the most widely accepted figure for describing the performance of a thermal imaging system. Many models have been proposed to predict it. The MRTD testing is a psychophysical task for which biases are unavoidable. It requires laboratory conditions such as normal air condition and a constant temperature. It also needs expensive measuring equipments and takes a considerable period of time. Especially when measuring imagers of the same type the test is time consuming. So an automated and intelligent measurement method should be discussed. This paper adopts the concept of automated MRTD testing using boundary contour system and fuzzy ARTMAP but uses different methods. It describes an Automated MRTD Testing procedure basing on Back-Propagation Network. Firstly we use frame grabber to capture the 4-bar target image data. Then according to image gray scale we segment the image to get 4-bar place and extract feature vector representing the image characteristic and human detection ability. These feature sets along with known target visibility are used to train the ANN (Artificial Neural Networks). Actually it is a nonlinear classification (of input dimensions) of the image series using ANN. Our task is to justify if image is resolvable or uncertainty. Then the trained ANN will emulate observer performance in determining MRTD. This method can reduce the uncertainties between observers and long time dependent factors by standardization. This paper will introduce the feature extraction algorithm demonstrate the feasibility of the whole process and give the accuracy of MRTD measurement.
收录类别	EI
内容类型	会议论文
源URL	[http://ir.ciomp.ac.cn/handle/181722/33689]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式 GB/T 7714	Sun J.,Ma D.. Intelligent MRTD testing for thermal imaging system using ANN (EI CONFERENCE)[C]. 见:ICO20: Remote Sensing and Infrared Devices and Systems, August 21, 2005 - August 26, 2005. Changchun, China.

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。