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长春光学精密机械与物理研究所
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中国科学院长春光学精密机械与物理研究所
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Grating interferometry method for torsion measurement (EI CONFERENCE)
Li X.-R.
;
Qiao Y.-F.
;
Liu W.
;
Zhang Y.-Y.
2006
会议名称
ICO20: Optical Information Processing, August 21, 2005 - August 26, 2005
会议地点
Changchun, China
关键词
Method of grating interferometry was presented for torsion angle measurement
moire fringe generated by two gratings is used in a new field
it breaks through moire fringe's routine application. Measurement principle is described
torsion angle can be gotten by the tilt angle or the width of moire fringe. Different from moire fringe's characteristic information extracting methods in traditional measurement fields
fringe-tilt method and fringe-width method were put forward to extract moire fringe's characteristic information. Fringe-tilt method is on the basis of moire fringe's tilt to acquire torsion angle
uniform formula was built aiming at all positions of two gratings in the coordinates
fringe-width method is on the basis of moire fringe's width to acquire torsion angle
three key problems are given about fringe-width method. Thick
middle and thin moire fringe were collected in experiments and processed by two methods
fringe-width method's result shows that magnitude of boat torsion error is satisfied with that of theoretical precision analysis
and the change rule of torsion error is also same to that of theoretical analysis
the thicker fringe is
the higher precision is
when fringe width arrives to be 1695m
the precision is 1.7"
the thinner fringe is
the lower precision is
when fringe width arrives to be 734.7m
the precision is 6.7". In addition to these
the results of repeatability experiments
sensibility experiments are given. In a word
the measurement principle is right and the precision of fringe processing is also reliable.
收录类别
EI
内容类型
会议论文
源URL
[
http://ir.ciomp.ac.cn/handle/181722/33638
]
专题
长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式
GB/T 7714
Li X.-R.,Qiao Y.-F.,Liu W.,et al. Grating interferometry method for torsion measurement (EI CONFERENCE)[C]. 见:ICO20: Optical Information Processing, August 21, 2005 - August 26, 2005. Changchun, China.
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