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长春光学精密机械与物理研究所
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中国科学院长春光学精密机械与物理研究所
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Optoelectronic non-contact measuring method for the taper of a bore (EI CONFERENCE)
Zhang L.
;
Tian Q.
;
Zhou X.
;
Yang L.
;
Fang Y.
;
Zhang G.
;
Xu X.
2005
会议名称
ICO20: Optical Devices and Instruments, August 21, 2005 - August 26, 2005
会议地点
Changchun, China
关键词
Based on laser optical triangulation displacement and grating displacement inspecting principle
optoelectronic non-contact inspecting method and inspecting system for the taper of small-calibre bore are presented. In this paper
the constitute and overall structure of the system are described. Then
the taper inspecting method and principle of the bore are discussed and theoretically analyzed
and also
the corresponding mathematics model is established. As inner diameter measurement is an important parameter for the taper of small-bore
an inner diameter laser non-contact measuring method is presented based on the structure characteristic of the taper of small-calibre bore
which adopted optoelectronic probe sensitive device (PSD) and laser optical triangulation inspecting principle. And then
the laser probe inner diameter measuring system is designed based them. Moreover
the measuring principle
the project of optical system of this measuring system are illuminated in detail in this article. The accuracy of inspecting system is verified by experiment. The results showed that the measuring error of inspecting system is superior to 0.005
and the inspecting repetition is superior to 0.003. It indicates that the system can fulfill the inspecting accuracy demand for inspecting the taper of the small-calibre bore
and the inspecting method is applicable.
收录类别
EI
内容类型
会议论文
源URL
[
http://ir.ciomp.ac.cn/handle/181722/33611
]
专题
长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式
GB/T 7714
Zhang L.,Tian Q.,Zhou X.,et al. Optoelectronic non-contact measuring method for the taper of a bore (EI CONFERENCE)[C]. 见:ICO20: Optical Devices and Instruments, August 21, 2005 - August 26, 2005. Changchun, China.
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