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	Image registration based on log-polar transform and SIFT features (EI CONFERENCE)
	Ding N. ; Liu Y. ; Jin Y. ; Zhu M.
	2010
会议名称	2010 International Conference on Computational and Information Sciences, ICCIS2010, December 17, 2010 - December 19, 2010
会议地点	Chengdu, Sichuan, China
关键词	This paper describes a novel image registration method that combines log-polar transform and SIFT to recover similarity transformations (rotation/ scale/ translation).We extracts SIFT feature points in the two images firstly. Then we use threshold Euclidean distance to coarsely match the feature points. After that the log-polar transform is applied to compute the rotation and scale parameters. And we can obtain the translation parameter by the location relationship of the feature points. 2010 IEEE.
页码	749-752
收录类别	EI
内容类型	会议论文
源URL	[http://ir.ciomp.ac.cn/handle/181722/33527]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式 GB/T 7714	Ding N.,Liu Y.,Jin Y.,et al. Image registration based on log-polar transform and SIFT features (EI CONFERENCE)[C]. 见:2010 International Conference on Computational and Information Sciences, ICCIS2010, December 17, 2010 - December 19, 2010. Chengdu, Sichuan, China.

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