Research on software defect prediction based on data mining (EI CONFERENCE)
Chen Y. ; Shen X.-H. ; Du P. ; Ge B.
2010
会议名称2nd International Conference on Computer and Automation Engineering, ICCAE 2010, February 26, 2010 - February 28, 2010
会议地点Singapore, Singapore
关键词As the development of computer technology software system becomes more and more complicated. Because of human's ability limit there must be a lot of defects generated in the software development life cycle. This paper reviewed the state of art in the field of software defect management and prediction and presented data mining technology briefly. Finally proposed an ideal software defect management and prediction system researched and analyzed several software defect prediction methods based on data mining techniques and specific models (Bayesian Network and PRM). With this system we can efficiently draw up some prevention and solution scheme to guide the development of new software. 2010 IEEE.
页码563-567
收录类别EI
内容类型会议论文
源URL[http://ir.ciomp.ac.cn/handle/181722/33460]  
专题长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式
GB/T 7714
Chen Y.,Shen X.-H.,Du P.,et al. Research on software defect prediction based on data mining (EI CONFERENCE)[C]. 见:2nd International Conference on Computer and Automation Engineering, ICCAE 2010, February 26, 2010 - February 28, 2010. Singapore, Singapore.
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