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	The method of the system error modification of photoelectric theodolite of T type (EI CONFERENCE)
	Zhao L. ; Zhu W. ; Zhang Y. ; Sun J.
	2012
会议名称	2012 International Conference on Optoelectronics and Microelectronics, ICOM 2012, August 23, 2012 - August 25, 2012
会议地点	Changchun, China
关键词	The system error of photoelectric theodolite includes Visual axis error This paper ratiocinates the formula of Azimuth orientation error horizontal axis error elevation zero error and Visual axis error of Photoelectric theodolite of T type by triangle relation in space. Photoelectric theodolite of U type with main visual axis and auxiliary visual axis shoots images and inverse images of marks to obtain system error data. Error is less than 0.4 second by comparing error data of auxiliary visual axis with error data of main visual axis and the precision of two methods is identical. It has been validated that the method of error measurement of photoelectric theodolite of T type is right. 2012 IEEE. vertical axis error Azimuth orientation error elevation zero error
页码	384-387
收录类别	EI
内容类型	会议论文
源URL	[http://ir.ciomp.ac.cn/handle/181722/33322]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式 GB/T 7714	Zhao L.,Zhu W.,Zhang Y.,et al. The method of the system error modification of photoelectric theodolite of T type (EI CONFERENCE)[C]. 见:2012 International Conference on Optoelectronics and Microelectronics, ICOM 2012, August 23, 2012 - August 25, 2012. Changchun, China.

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