Error analysis of the micro temperature control system (EI CONFERENCE) Han Z.
; Song K.
2013
会议名称 2012 International Conference on Measurement, Instrumentation and Automation, ICMIA 2012, September 15, 2012 - September 16, 2012
会议地点 Guangzhou, China
关键词 In order to improve the measurement accuracy of optical detection instruments
temperature control circuits for narrow band-pass filters are given
and the error analysis is applied to temperature control circuits.The principle of a temperature measurement circuit is studied and the method of a driver circuit is described. A variety of influencing factors of temperature control accuracy are discussed. Moreover
for these error factors
improvement measures are given to reduce the nonlinear error. Finally
circuit parameter error is quantified to propose a calculation method for margin of error in a temperature control system. (2013) Trans Tech Publications
Switzerland.
页码 364-367
收录类别 EI
内容类型 会议论文
源URL [http://ir.ciomp.ac.cn/handle/181722/33305 ] 专题 长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文 推荐引用方式 GB/T 7714
Han Z.,Song K.. Error analysis of the micro temperature control system (EI CONFERENCE)[C]. 见:2012 International Conference on Measurement, Instrumentation and Automation, ICMIA 2012, September 15, 2012 - September 16, 2012. Guangzhou, China.
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。
修改评论