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	Application of interferometry measurement in large-scale optic-electrical theodolite (EI CONFERENCE)
	Zhao N. ; Sun Z.
	2013
会议名称	2012 International Conference on Sensors, Measurement and Intelligent Materials, ICSMIM 2012, December 26, 2012 - December 27, 2012
会议地点	Guilin, China
关键词	Interferometry is a very important method in high accuracy measurement for optical system. This article briefly introduced the conception of interferometry and took a product of 4D Technology as an example to carry on the measurement. A large-scale optic-electrical Theodolite in assemblage was measured and its primary mirror was 400mm in diameter. With the analysis of the results some micro adjustments of the mechanical structure proceed and it made the system perform better. The final results of the whole system is 1.061 in P-V value and 0.1136 in RMS value (=632.8nm) this meets the demand of optical design and practical application. The result demonstrates that interferometry is a good way to be utilized and optimize in the procedure of assemble. (2013) Trans Tech Publications Switzerland.
页码	335-338
收录类别	EI
内容类型	会议论文
源URL	[http://ir.ciomp.ac.cn/handle/181722/33279]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式 GB/T 7714	Zhao N.,Sun Z.. Application of interferometry measurement in large-scale optic-electrical theodolite (EI CONFERENCE)[C]. 见:2012 International Conference on Sensors, Measurement and Intelligent Materials, ICSMIM 2012, December 26, 2012 - December 27, 2012. Guilin, China.

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