A small thickness measurement system based on PSD and FPGA (EI CONFERENCE)
Guo J. ; He X. ; Wei Z. ; Wu Y.
2011
会议名称3rd International Conference on Measuring Technology and Mechatronics Automation, ICMTMA 2011, January 6, 2011 - January 7, 2011
会议地点Shanghai, China
关键词Considering that the requirement of industrial manufacture An AT89S51 singlechip works as the core processor of the system. By two laser triangulation a small thickness measurement system based on PSD and FPGA is presented. It takes S3931 PSD of one dimension as position detection device A FPGA produces logic control signals for the whole system the small displacement is converted to differential voltages which is made by Hamamatsu in Japan and after amplification and A/D transformation 8-bit parallel data is send to singlechip from FPGA by external interrupts and the final calculation results output to the LCD display module. After digital micro meter calibration we get the small thickness. Experiments show that the detection accuracy of the system is not less than 10um.
页码267-270
收录类别EI
内容类型会议论文
源URL[http://ir.ciomp.ac.cn/handle/181722/33209]  
专题长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
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GB/T 7714
Guo J.,He X.,Wei Z.,et al. A small thickness measurement system based on PSD and FPGA (EI CONFERENCE)[C]. 见:3rd International Conference on Measuring Technology and Mechatronics Automation, ICMTMA 2011, January 6, 2011 - January 7, 2011. Shanghai, China.
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