A NEW DFT ARCHITECTURE TO REDUCE TEST DATA VOLUME AND TEST APPLICATION TIME | |
Ling, Zhang; Jishun, Kuang; Junjin, Mei | |
刊名 | ENGINEERING REVIEW |
2016 | |
卷号 | Vol.36 No.3页码:197-202 |
关键词 | Test data compression Integrated circuits Broadcast architecture Design for test |
ISSN号 | 1330-9587 |
URL标识 | 查看原文 |
公开日期 | [db:dc_date_available] |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/6073705 |
专题 | 湖南大学 |
作者单位 | 1.College of Information Science and Engineering, Hunan University, Changsha 2.410082, China 3.School of Computer, Hubei Polytechnic University, Huangshi 4.435003, China |
推荐引用方式 GB/T 7714 | Ling, Zhang,Jishun, Kuang,Junjin, Mei. A NEW DFT ARCHITECTURE TO REDUCE TEST DATA VOLUME AND TEST APPLICATION TIME[J]. ENGINEERING REVIEW,2016,Vol.36 No.3:197-202. |
APA | Ling, Zhang,Jishun, Kuang,&Junjin, Mei.(2016).A NEW DFT ARCHITECTURE TO REDUCE TEST DATA VOLUME AND TEST APPLICATION TIME.ENGINEERING REVIEW,Vol.36 No.3,197-202. |
MLA | Ling, Zhang,et al."A NEW DFT ARCHITECTURE TO REDUCE TEST DATA VOLUME AND TEST APPLICATION TIME".ENGINEERING REVIEW Vol.36 No.3(2016):197-202. |
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