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A high-conductivity insulated gate bipolar transistor with Schottky hole barrier contact
Jiang MX(蒋梦轩); Shen Z(沈征); Wang J(王俊); Yin X(尹新); Shuai ZK(帅智康); Lu J(陆江)
刊名Journal of Semiconductors
2016
卷号Vol.37 No.2页码:024011(1-5)
关键词breakdown voltage conductivity modulation current density latch up IGBT
ISSN号1674-4926
URL标识查看原文
公开日期[db:dc_date_available]
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/6071646
专题湖南大学
推荐引用方式
GB/T 7714
Jiang MX,Shen Z,Wang J,et al. A high-conductivity insulated gate bipolar transistor with Schottky hole barrier contact[J]. Journal of Semiconductors,2016,Vol.37 No.2:024011(1-5).
APA Jiang MX,Shen Z,Wang J,Yin X,Shuai ZK,&Lu J.(2016).A high-conductivity insulated gate bipolar transistor with Schottky hole barrier contact.Journal of Semiconductors,Vol.37 No.2,024011(1-5).
MLA Jiang MX,et al."A high-conductivity insulated gate bipolar transistor with Schottky hole barrier contact".Journal of Semiconductors Vol.37 No.2(2016):024011(1-5).
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