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	Design of on-line thickness measurement system based on CCD
	Li, Tianze; Wen, Fang; Lu, Hengwei
	2009
会议名称	Photonics and Optoelectronics Meetings (POEM) 2009 - Industry Lasers and Applications
会议日期	August 8, 2009 - August 10, 2009
卷号	7515
DOI	10.1117/12.841116
收录类别	EI
会议录	Proceedings of SPIE - The International Society for Optical Engineering
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/6070652
专题	山东大学
作者单位	School of Electric and Electronic Engineering, Shandong University of Technology, Shandong Zibo 255049, China
推荐引用方式 GB/T 7714	Li, Tianze,Wen, Fang,Lu, Hengwei. Design of on-line thickness measurement system based on CCD[C]. 见:Photonics and Optoelectronics Meetings (POEM) 2009 - Industry Lasers and Applications. August 8, 2009 - August 10, 2009.

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