System study and error analysis of new photoelectricity film test | |
Li, Tianze; Wang, Shuyun; Wen, Fang; Tan, Boxue | |
2009 | |
会议名称 | 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment |
会议日期 | November 19, 2008 - November 21, 2008 |
卷号 | 7283 |
DOI | 10.1117/12.828683 |
收录类别 | EI |
会议录 | Proceedings of SPIE - The International Society for Optical Engineering
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URL标识 | 查看原文 |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/6065833 |
专题 | 山东大学 |
作者单位 | 1.School of Electric and Electronic Engineering, Shandong University of Technology, Zibo Shandong 255049, China 2.[Wa |
推荐引用方式 GB/T 7714 | Li, Tianze,Wang, Shuyun,Wen, Fang,et al. System study and error analysis of new photoelectricity film test[C]. 见:4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment. November 19, 2008 - November 21, 2008. |
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