| Effects of Atmospheric Pressure on Tracking Failure of Epoxy/SiO2 Nanocomposite | |
| Zhang, Ji Wei; Li, Qing Quan; Ren, Ang; Diao, Bo Qing; Yin, Mao Lin; He, Feng; Li, Bin; Zhang, Xue Qiao | |
| 2015 | |
| 会议名称 | IEEE International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD) |
| 会议日期 | NOV 20-23, 2015 |
| 关键词 | epoxy SiO2 composite tracking failure atmospheric pressure |
| 页码 | 324-325 |
| 收录类别 | CPCI-S |
| 会议录 | 2015 IEEE International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD)
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| URL标识 | 查看原文 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/6035640 |
| 专题 | 山东大学 |
| 作者单位 | Shandong Univ, Sch Elect Engn, Shandong Prov Key Lab UHV Transmiss Technol & Equ, Jinan 250061, Peoples R Chi |
| 推荐引用方式 GB/T 7714 | Zhang, Ji Wei,Li, Qing Quan,Ren, Ang,et al. Effects of Atmospheric Pressure on Tracking Failure of Epoxy/SiO2 Nanocomposite[C]. 见:IEEE International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD). NOV 20-23, 2015. |
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