Characterization and Detailed Analysis of The Crosstalk With SiC MOSFET | |
Jing Yang; Gao Feng; Li Huadong; Chen Suhong | |
2018 | |
会议名称 | 1st Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia) |
会议日期 | MAY 16-18, 2018 |
关键词 | SiC crosstalk synchronous MOSFET reverse recovery characteristic |
页码 | 239-243 |
收录类别 | CPCI-S |
会议录 | 2018 1ST WORKSHOP ON WIDE BANDGAP POWER DEVICES AND APPLICATIONS IN ASIA (WIPDA ASIA) |
URL标识 | 查看原文 |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/6026839 |
专题 | 山东大学 |
作者单位 | 1.Shandong Univ, Sch Elect Engn, Jinan, Shandong, Peoples R China. 2.State Grid Shandong Elect Power Re |
推荐引用方式 GB/T 7714 | Jing Yang,Gao Feng,Li Huadong,et al. Characterization and Detailed Analysis of The Crosstalk With SiC MOSFET[C]. 见:1st Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia). MAY 16-18, 2018. |
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