| A new test points selection method for analog fault dictionary techniques | |
| Zhao, Dongsheng; He, Yuzhu | |
| 刊名 | ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING
 |
| 2015 | |
| 卷号 | 82页码:435-448 |
| 关键词 | Analog fault diagnosis Integer-coded fault dictionary Fault-isolated table Test points selection |
| ISSN号 | 0925-1030 |
| DOI | 10.1007/s10470-014-0469-8 |
| URL标识 | 查看原文 |
| 收录类别 | SCIE ; EI |
| WOS记录号 | WOS:000348435400009 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/5961016 |
| 专题 | 北京航空航天大学 |
| 推荐引用方式 GB/T 7714 | Zhao, Dongsheng,He, Yuzhu. A new test points selection method for analog fault dictionary techniques[J]. ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING,2015,82:435-448. |
| APA | Zhao, Dongsheng,&He, Yuzhu.(2015).A new test points selection method for analog fault dictionary techniques.ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING,82,435-448. |
| MLA | Zhao, Dongsheng,et al."A new test points selection method for analog fault dictionary techniques".ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING 82(2015):435-448. |
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