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	Analog circuit fault diagnosis based on Quantum Clustering based Multi-valued Quantum Fuzzification Decision Tree (QC-MQFDT)
	Cui, Yiqian; Shi, Junyou; Wang, Zili
刊名	MEASUREMENT
	2016
卷号	93页码:421-434
关键词	Decision tree Quantum clustering (QC) Quantum membership function (QMF) C4.5 algorithm Quantum fuzzy entropy (QFE)
ISSN号	0263-2241
DOI	10.1016/j.measurement.2016.07.018
URL标识	查看原文
收录类别	SCIE ; EI
WOS记录号	WOS:000386869600050
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5958918
专题	北京航空航天大学
推荐引用方式 GB/T 7714	Cui, Yiqian,Shi, Junyou,Wang, Zili. Analog circuit fault diagnosis based on Quantum Clustering based Multi-valued Quantum Fuzzification Decision Tree (QC-MQFDT)[J]. MEASUREMENT,2016,93:421-434.
APA	Cui, Yiqian,Shi, Junyou,&Wang, Zili.(2016).Analog circuit fault diagnosis based on Quantum Clustering based Multi-valued Quantum Fuzzification Decision Tree (QC-MQFDT).MEASUREMENT,93,421-434.
MLA	Cui, Yiqian,et al."Analog circuit fault diagnosis based on Quantum Clustering based Multi-valued Quantum Fuzzification Decision Tree (QC-MQFDT)".MEASUREMENT 93(2016):421-434.

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