CORC  > 北京航空航天大学
Performance Upper Limit of sub-10 nm Monolayer MoS2 Transistors
Ni, Zeyuan; Ye, Meng; Ma, Jianhua; Wang, Yangyang; Quhe, Ruge; Zheng, Jiaxin; Dai, Lun; Yu, Dapeng; Shi, Junjie; Yang, Jinbo
刊名ADVANCED ELECTRONIC MATERIALS
2016
卷号2
ISSN号2199-160X
DOI10.1002/aelm.201600191
URL标识查看原文
收录类别SCIE
WOS记录号WOS:000384455800014
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/5955015
专题北京航空航天大学
推荐引用方式
GB/T 7714
Ni, Zeyuan,Ye, Meng,Ma, Jianhua,et al. Performance Upper Limit of sub-10 nm Monolayer MoS2 Transistors[J]. ADVANCED ELECTRONIC MATERIALS,2016,2.
APA Ni, Zeyuan.,Ye, Meng.,Ma, Jianhua.,Wang, Yangyang.,Quhe, Ruge.,...&Lu, Jing.(2016).Performance Upper Limit of sub-10 nm Monolayer MoS2 Transistors.ADVANCED ELECTRONIC MATERIALS,2.
MLA Ni, Zeyuan,et al."Performance Upper Limit of sub-10 nm Monolayer MoS2 Transistors".ADVANCED ELECTRONIC MATERIALS 2(2016).
个性服务
查看访问统计
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。


©版权所有 ©2017 CSpace - Powered by CSpace