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	Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances
	Cui, Yiqian; Shi, Junyou; Wang, Zili
刊名	JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
	2016
卷号	32页码:661-679
关键词	Test point selection Clustering-based discretization (CBD) Extended fault dictionary (EFD) Entropy measure Analog circuit fault diagnosis
ISSN号	0923-8174
DOI	10.1007/s10836-016-5620-2
URL标识	查看原文
收录类别	SCIE ; EI
WOS记录号	WOS:000390067700002
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5953492
专题	北京航空航天大学
推荐引用方式 GB/T 7714	Cui, Yiqian,Shi, Junyou,Wang, Zili. Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances[J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,2016,32:661-679.
APA	Cui, Yiqian,Shi, Junyou,&Wang, Zili.(2016).Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances.JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,32,661-679.
MLA	Cui, Yiqian,et al."Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances".JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 32(2016):661-679.

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