| How Domain Knowledge Accumulation Influences Software Defects: An Empirical Analysis | |
| Xiao, Peng; Liu, Bin; Yan, Xiaobo; Huang, Fuqun | |
| 2017 | |
| 会议名称 | 2017 IEEE INTERNATIONAL CONFERENCE ON SOFTWARE QUALITY, RELIABILITY AND SECURITY COMPANION (QRS-C) |
| 会议日期 | 2017-01-01 |
| 关键词 | software defect domain knowledge severity level defect density risk control |
| 页码 | 24-30 |
| 收录类别 | EI ; CPCI-S |
| URL标识 | 查看原文 |
| WOS记录号 | WOS:000426819400004 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/5947285 |
| 专题 | 北京航空航天大学 |
| 推荐引用方式 GB/T 7714 | Xiao, Peng,Liu, Bin,Yan, Xiaobo,et al. How Domain Knowledge Accumulation Influences Software Defects: An Empirical Analysis[C]. 见:2017 IEEE INTERNATIONAL CONFERENCE ON SOFTWARE QUALITY, RELIABILITY AND SECURITY COMPANION (QRS-C). 2017-01-01. |
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