Multi-Stress Equivalent Optimum Design for Ramp-Stress Accelerated Life Test Plans Based on D-Efficiency | |
Chen, Yunxia; Sun, Wenbin; Xu, Dan | |
刊名 | IEEE ACCESS
![]() |
2017 | |
卷号 | 5页码:25854-25862 |
关键词 | Multi-stress equivalent optimum design ramp-stress accelerated life test D-efficiency |
ISSN号 | 2169-3536 |
DOI | 10.1109/ACCESS.2017.2769668 |
URL标识 | 查看原文 |
收录类别 | SCIE |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/5945138 |
专题 | 北京航空航天大学 |
推荐引用方式 GB/T 7714 | Chen, Yunxia,Sun, Wenbin,Xu, Dan. Multi-Stress Equivalent Optimum Design for Ramp-Stress Accelerated Life Test Plans Based on D-Efficiency[J]. IEEE ACCESS,2017,5:25854-25862. |
APA | Chen, Yunxia,Sun, Wenbin,&Xu, Dan.(2017).Multi-Stress Equivalent Optimum Design for Ramp-Stress Accelerated Life Test Plans Based on D-Efficiency.IEEE ACCESS,5,25854-25862. |
MLA | Chen, Yunxia,et al."Multi-Stress Equivalent Optimum Design for Ramp-Stress Accelerated Life Test Plans Based on D-Efficiency".IEEE ACCESS 5(2017):25854-25862. |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论