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	Multi-Stress Equivalent Optimum Design for Ramp-Stress Accelerated Life Test Plans Based on D-Efficiency
	Chen, Yunxia; Sun, Wenbin; Xu, Dan
刊名	IEEE ACCESS
	2017
卷号	5页码:25854-25862
关键词	Multi-stress equivalent optimum design ramp-stress accelerated life test D-efficiency
ISSN号	2169-3536
DOI	10.1109/ACCESS.2017.2769668
URL标识	查看原文
收录类别	SCIE
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5945138
专题	北京航空航天大学
推荐引用方式 GB/T 7714	Chen, Yunxia,Sun, Wenbin,Xu, Dan. Multi-Stress Equivalent Optimum Design for Ramp-Stress Accelerated Life Test Plans Based on D-Efficiency[J]. IEEE ACCESS,2017,5:25854-25862.
APA	Chen, Yunxia,Sun, Wenbin,&Xu, Dan.(2017).Multi-Stress Equivalent Optimum Design for Ramp-Stress Accelerated Life Test Plans Based on D-Efficiency.IEEE ACCESS,5,25854-25862.
MLA	Chen, Yunxia,et al."Multi-Stress Equivalent Optimum Design for Ramp-Stress Accelerated Life Test Plans Based on D-Efficiency".IEEE ACCESS 5(2017):25854-25862.

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