| Research on physics-of-failure model for electro-migration damage accumulation under multi-level stress profile based on accelerated factor | |
| Wan, Bo; Fu, Guicui; Li, Yanruoyue | |
| 2017 | |
| 会议名称 | PROCEEDINGS OF THE 2ND INTERNATIONAL CONFERENCE ON RELIABILITY SYSTEMS ENGINEERING (ICRSE 2017) |
| 会议日期 | 2017-01-01 |
| 关键词 | component formatting electro-migration damage accumulation multi-level stress accelerated factor |
| 收录类别 | CPCI-S |
| URL标识 | 查看原文 |
| WOS记录号 | WOS:000425930200018 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/5944499 |
| 专题 | 北京航空航天大学 |
| 推荐引用方式 GB/T 7714 | Wan, Bo,Fu, Guicui,Li, Yanruoyue. Research on physics-of-failure model for electro-migration damage accumulation under multi-level stress profile based on accelerated factor[C]. 见:PROCEEDINGS OF THE 2ND INTERNATIONAL CONFERENCE ON RELIABILITY SYSTEMS ENGINEERING (ICRSE 2017). 2017-01-01. |
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