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	Ultrasensitive SERS Detection by Defect Engineering on Single Cu2O Superstructure Particle
	Lin, Jie; Shang, Yang; Li, Xiaoxia; Yu, Jian; Wang, Xiaotian; Guo, Lin
刊名	ADVANCED MATERIALS
	2017
卷号	29
关键词	charge-transfer defects electrostatic adsorption self-assembly single-particle SERS
ISSN号	0935-9648
DOI	10.1002/adma.201604797
URL标识	查看原文
收录类别	SCIE ; EI ; PUBMED
WOS记录号	WOS:000396142100029
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5942627
专题	北京航空航天大学
推荐引用方式 GB/T 7714	Lin, Jie,Shang, Yang,Li, Xiaoxia,et al. Ultrasensitive SERS Detection by Defect Engineering on Single Cu2O Superstructure Particle[J]. ADVANCED MATERIALS,2017,29.
APA	Lin, Jie,Shang, Yang,Li, Xiaoxia,Yu, Jian,Wang, Xiaotian,&Guo, Lin.(2017).Ultrasensitive SERS Detection by Defect Engineering on Single Cu2O Superstructure Particle.ADVANCED MATERIALS,29.
MLA	Lin, Jie,et al."Ultrasensitive SERS Detection by Defect Engineering on Single Cu2O Superstructure Particle".ADVANCED MATERIALS 29(2017).

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