| Dynamically Obfuscated Scan for Protecting IPs Against Scan-Based Attacks Throughout Supply Chain | |
| Zhang, Dongrong; He, Miao; Wang, Xiaoxiao; Tehranipoor, Mark | |
| 2017 | |
| 会议名称 | 35th IEEE VLSI TEST SYMPOSIUM (VTS) |
| 会议日期 | 2017-04-09 |
| 会议地点 | Las Vegas, NV |
| 关键词 | Secure Scan Testability Scan-Based Attacks Supply Chain |
| 收录类别 | EI ; CPCI-S |
| URL标识 | 查看原文 |
| WOS记录号 | WOS:000403393000031 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/5939003 |
| 专题 | 北京航空航天大学 |
| 推荐引用方式 GB/T 7714 | Zhang, Dongrong,He, Miao,Wang, Xiaoxiao,et al. Dynamically Obfuscated Scan for Protecting IPs Against Scan-Based Attacks Throughout Supply Chain[C]. 见:35th IEEE VLSI TEST SYMPOSIUM (VTS). Las Vegas, NV. 2017-04-09. |
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