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	A Bayesian Optimal Design for Sequential Accelerated Degradation Testing
	Li, Xiaoyang; Hu, Yuqing; Sun, Fuqiang; Kang, Rui
刊名	ENTROPY
	2017
卷号	19
关键词	Bayesian optimal design accelerated degradation testing (ADT) sequential decision D-optimality inverse Gaussian process
ISSN号	1099-4300
DOI	10.3390/e19070325
URL标识	查看原文
收录类别	SCIE
WOS记录号	WOS:000406701500035
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5938246
专题	北京航空航天大学
推荐引用方式 GB/T 7714	Li, Xiaoyang,Hu, Yuqing,Sun, Fuqiang,et al. A Bayesian Optimal Design for Sequential Accelerated Degradation Testing[J]. ENTROPY,2017,19.
APA	Li, Xiaoyang,Hu, Yuqing,Sun, Fuqiang,&Kang, Rui.(2017).A Bayesian Optimal Design for Sequential Accelerated Degradation Testing.ENTROPY,19.
MLA	Li, Xiaoyang,et al."A Bayesian Optimal Design for Sequential Accelerated Degradation Testing".ENTROPY 19(2017).

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