Real-time scan speed control of the atomic force microscopy for reducing imaging time based on sample topography | |
Zhang, Yingxu; Li, Yingzi; Shan, Guanqiao; Chen, Yifu; Wang, Zhenyu; Qian, Jianqiang | |
刊名 | MICRON
![]() |
2018 | |
卷号 | 106页码:1-6 |
关键词 | Atomic force microscopy Amplitude modulation Real-time control Fast imaging |
ISSN号 | 0968-4328 |
DOI | 10.1016/j.micron.2017.12.004 |
URL标识 | 查看原文 |
收录类别 | SCIE ; EI ; PUBMED |
WOS记录号 | WOS:000425078900001 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/5936275 |
专题 | 北京航空航天大学 |
推荐引用方式 GB/T 7714 | Zhang, Yingxu,Li, Yingzi,Shan, Guanqiao,et al. Real-time scan speed control of the atomic force microscopy for reducing imaging time based on sample topography[J]. MICRON,2018,106:1-6. |
APA | Zhang, Yingxu,Li, Yingzi,Shan, Guanqiao,Chen, Yifu,Wang, Zhenyu,&Qian, Jianqiang.(2018).Real-time scan speed control of the atomic force microscopy for reducing imaging time based on sample topography.MICRON,106,1-6. |
MLA | Zhang, Yingxu,et al."Real-time scan speed control of the atomic force microscopy for reducing imaging time based on sample topography".MICRON 106(2018):1-6. |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论