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	Electrically reversible cracks in an intermetallic film controlled by an electric field
	Liu, Z. Q.; Liu, J. H.; Biegalski, M. D.; Hu, J.M.; Shang, S. L.; Ji, Y.; Wang, J. M.; Hsu, S. L.; Wong, A. T.; Cordill, M. J.
刊名	NATURE COMMUNICATIONS
	2018
卷号	9页码:41
关键词	electric field film frequency analysis instrumentation substrate thin section
ISSN号	2041-1723
DOI	10.1038/s41467-017-02454-8
URL标识	查看原文
收录类别	SCIE ; PUBMED
WOS记录号	WOS:000419308000002
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5935827
专题	北京航空航天大学
推荐引用方式 GB/T 7714	Liu, Z. Q.,Liu, J. H.,Biegalski, M. D.,et al. Electrically reversible cracks in an intermetallic film controlled by an electric field[J]. NATURE COMMUNICATIONS,2018,9:41.
APA	Liu, Z. Q..,Liu, J. H..,Biegalski, M. D..,Hu, J.M..,Shang, S. L..,...&Ramesh, R..(2018).Electrically reversible cracks in an intermetallic film controlled by an electric field.NATURE COMMUNICATIONS,9,41.
MLA	Liu, Z. Q.,et al."Electrically reversible cracks in an intermetallic film controlled by an electric field".NATURE COMMUNICATIONS 9(2018):41.

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