High-Speed Spectroscopic Transient Absorption Imaging of Defects in Graphene | |
Huang, Kai-Chih; McCall, Jeremy; Wang, Pu; Liao, Chien-Sheng; Eakins, Gregory; Cheng, Ji-Xin; Yang, Chen | |
刊名 | NANO LETTERS
![]() |
2018 | |
卷号 | 18页码:1489-1497 |
关键词 | Graphene grain boundary ultrahigh-speed microscopy transient absorption microscopy |
ISSN号 | 1530-6984 |
DOI | 10.1021/acs.nanolett.7b05283 |
URL标识 | 查看原文 |
收录类别 | SCIE ; EI ; PUBMED |
WOS记录号 | WOS:000425559700121 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/5935284 |
专题 | 北京航空航天大学 |
推荐引用方式 GB/T 7714 | Huang, Kai-Chih,McCall, Jeremy,Wang, Pu,et al. High-Speed Spectroscopic Transient Absorption Imaging of Defects in Graphene[J]. NANO LETTERS,2018,18:1489-1497. |
APA | Huang, Kai-Chih.,McCall, Jeremy.,Wang, Pu.,Liao, Chien-Sheng.,Eakins, Gregory.,...&Yang, Chen.(2018).High-Speed Spectroscopic Transient Absorption Imaging of Defects in Graphene.NANO LETTERS,18,1489-1497. |
MLA | Huang, Kai-Chih,et al."High-Speed Spectroscopic Transient Absorption Imaging of Defects in Graphene".NANO LETTERS 18(2018):1489-1497. |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论