| High-Speed Spectroscopic Transient Absorption Imaging of Defects in Graphene | |
| Huang, Kai-Chih; McCall, Jeremy; Wang, Pu; Liao, Chien-Sheng; Eakins, Gregory; Cheng, Ji-Xin; Yang, Chen | |
| 刊名 | NANO LETTERS
 |
| 2018 | |
| 卷号 | 18页码:1489-1497 |
| 关键词 | Graphene grain boundary ultrahigh-speed microscopy transient absorption microscopy |
| ISSN号 | 1530-6984 |
| DOI | 10.1021/acs.nanolett.7b05283 |
| URL标识 | 查看原文 |
| 收录类别 | SCIE ; EI ; PUBMED |
| WOS记录号 | WOS:000425559700121 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/5935284 |
| 专题 | 北京航空航天大学 |
| 推荐引用方式 GB/T 7714 | Huang, Kai-Chih,McCall, Jeremy,Wang, Pu,et al. High-Speed Spectroscopic Transient Absorption Imaging of Defects in Graphene[J]. NANO LETTERS,2018,18:1489-1497. |
| APA | Huang, Kai-Chih.,McCall, Jeremy.,Wang, Pu.,Liao, Chien-Sheng.,Eakins, Gregory.,...&Yang, Chen.(2018).High-Speed Spectroscopic Transient Absorption Imaging of Defects in Graphene.NANO LETTERS,18,1489-1497. |
| MLA | Huang, Kai-Chih,et al."High-Speed Spectroscopic Transient Absorption Imaging of Defects in Graphene".NANO LETTERS 18(2018):1489-1497. |
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