| Addressing the Thermal Issues of STT-MRAM From Compact Modeling to Design Techniques | |
| Zhang, Liuyang; Cheng, Yuanqing; Kang, Wang; Torres, Lionel; Zhang, Youguang; Todri-Sanial, Aida; Zhao, Weisheng | |
| 刊名 | IEEE TRANSACTIONS ON NANOTECHNOLOGY
 |
| 2018 | |
| 卷号 | 17页码:345-352 |
| 关键词 | Magnetic tunnel junction (MTJ) read reliability sensing circuit STT-MRAM thermal fluctuations |
| ISSN号 | 1536-125X |
| DOI | 10.1109/TNANO.2018.2803340 |
| URL标识 | 查看原文 |
| 收录类别 | SCIE ; EI |
| WOS记录号 | WOS:000427251000020 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/5934732 |
| 专题 | 北京航空航天大学 |
| 推荐引用方式 GB/T 7714 | Zhang, Liuyang,Cheng, Yuanqing,Kang, Wang,et al. Addressing the Thermal Issues of STT-MRAM From Compact Modeling to Design Techniques[J]. IEEE TRANSACTIONS ON NANOTECHNOLOGY,2018,17:345-352. |
| APA | Zhang, Liuyang.,Cheng, Yuanqing.,Kang, Wang.,Torres, Lionel.,Zhang, Youguang.,...&Zhao, Weisheng.(2018).Addressing the Thermal Issues of STT-MRAM From Compact Modeling to Design Techniques.IEEE TRANSACTIONS ON NANOTECHNOLOGY,17,345-352. |
| MLA | Zhang, Liuyang,et al."Addressing the Thermal Issues of STT-MRAM From Compact Modeling to Design Techniques".IEEE TRANSACTIONS ON NANOTECHNOLOGY 17(2018):345-352. |
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