| In-situ SEM and optical microscopy testing for investigation of fatigue crack growth mechanism under overload | |
| Zhang, Wei; Cai, Liang | |
| 2018 | |
| 会议名称 | 12TH INTERNATIONAL FATIGUE CONGRESS (FATIGUE 2018) |
| 会议日期 | 2018-01-01 |
| 关键词 | Crack closure Fatigue crack propagation Fatigue of materials Microcracks Optical data storage Optical microscopy Scanning electron microscopy Classical solutions Crack closure levels Crack growth behavior Crack-tip deformation Digital imaging correlation Fatigue crack growth mechanism Variable amplitude loading Very high resolution (VHR) image Crack tips |
| 卷号 | 165 |
| 收录类别 | CPCI-S |
| URL标识 | 查看原文 |
| WOS记录号 | WOS:000478990600115 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/5932663 |
| 专题 | 北京航空航天大学 |
| 推荐引用方式 GB/T 7714 | Zhang, Wei,Cai, Liang. In-situ SEM and optical microscopy testing for investigation of fatigue crack growth mechanism under overload[C]. 见:12TH INTERNATIONAL FATIGUE CONGRESS (FATIGUE 2018). 2018-01-01. |
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