CORC  > 北京航空航天大学
Fabrication and Optimization of High Aspect Ratio Through-Silicon-Vias Electroplating for 3D Inductor
Li, Haiwang; Liu, Jiasi; Xu, Tiantong; Xia, Jingchao; Tan, Xiao; Tao, Zhi
刊名MICROMACHINES
2018
卷号9
关键词through-silicon-vias (TSV) high aspect ratio control variable method electroplating three-dimensional (3D) inductor
ISSN号2072-666X
DOI10.3390/mi9100528
URL标识查看原文
收录类别SCIE ; PUBMED
WOS记录号WOS:000448554800054
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/5929741
专题北京航空航天大学
推荐引用方式
GB/T 7714
Li, Haiwang,Liu, Jiasi,Xu, Tiantong,et al. Fabrication and Optimization of High Aspect Ratio Through-Silicon-Vias Electroplating for 3D Inductor[J]. MICROMACHINES,2018,9.
APA Li, Haiwang,Liu, Jiasi,Xu, Tiantong,Xia, Jingchao,Tan, Xiao,&Tao, Zhi.(2018).Fabrication and Optimization of High Aspect Ratio Through-Silicon-Vias Electroplating for 3D Inductor.MICROMACHINES,9.
MLA Li, Haiwang,et al."Fabrication and Optimization of High Aspect Ratio Through-Silicon-Vias Electroplating for 3D Inductor".MICROMACHINES 9(2018).
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