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Variation-Resilient True Random Number Generators Based on Multiple STT-MTJs
Qu, Yuanzhuo; Cockburn, Bruce E.; Huang, Zhe; Cai, Hao; Zhang, Yue; Zhao, Weisheng; Han, Jie
刊名IEEE TRANSACTIONS ON NANOTECHNOLOGY
2018
卷号17页码:1270-1281
关键词Magnetic tunnel junctions (MTJs) true random number generators (TRNGs) statistical tests variations correlations
ISSN号1536-125X
DOI10.1109/TNANO.2018.2873970
URL标识查看原文
收录类别SCIE ; EI
WOS记录号WOS:000449979300027
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/5929526
专题北京航空航天大学
推荐引用方式
GB/T 7714
Qu, Yuanzhuo,Cockburn, Bruce E.,Huang, Zhe,et al. Variation-Resilient True Random Number Generators Based on Multiple STT-MTJs[J]. IEEE TRANSACTIONS ON NANOTECHNOLOGY,2018,17:1270-1281.
APA Qu, Yuanzhuo.,Cockburn, Bruce E..,Huang, Zhe.,Cai, Hao.,Zhang, Yue.,...&Han, Jie.(2018).Variation-Resilient True Random Number Generators Based on Multiple STT-MTJs.IEEE TRANSACTIONS ON NANOTECHNOLOGY,17,1270-1281.
MLA Qu, Yuanzhuo,et al."Variation-Resilient True Random Number Generators Based on Multiple STT-MTJs".IEEE TRANSACTIONS ON NANOTECHNOLOGY 17(2018):1270-1281.
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