Variation-Resilient True Random Number Generators Based on Multiple STT-MTJs | |
Qu, Yuanzhuo; Cockburn, Bruce E.; Huang, Zhe; Cai, Hao; Zhang, Yue; Zhao, Weisheng; Han, Jie | |
刊名 | IEEE TRANSACTIONS ON NANOTECHNOLOGY
![]() |
2018 | |
卷号 | 17页码:1270-1281 |
关键词 | Magnetic tunnel junctions (MTJs) true random number generators (TRNGs) statistical tests variations correlations |
ISSN号 | 1536-125X |
DOI | 10.1109/TNANO.2018.2873970 |
URL标识 | 查看原文 |
收录类别 | SCIE ; EI |
WOS记录号 | WOS:000449979300027 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/5929526 |
专题 | 北京航空航天大学 |
推荐引用方式 GB/T 7714 | Qu, Yuanzhuo,Cockburn, Bruce E.,Huang, Zhe,et al. Variation-Resilient True Random Number Generators Based on Multiple STT-MTJs[J]. IEEE TRANSACTIONS ON NANOTECHNOLOGY,2018,17:1270-1281. |
APA | Qu, Yuanzhuo.,Cockburn, Bruce E..,Huang, Zhe.,Cai, Hao.,Zhang, Yue.,...&Han, Jie.(2018).Variation-Resilient True Random Number Generators Based on Multiple STT-MTJs.IEEE TRANSACTIONS ON NANOTECHNOLOGY,17,1270-1281. |
MLA | Qu, Yuanzhuo,et al."Variation-Resilient True Random Number Generators Based on Multiple STT-MTJs".IEEE TRANSACTIONS ON NANOTECHNOLOGY 17(2018):1270-1281. |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论