| Degradation Modeling and Performance Monitoring of Electro-optical Detection System via Dynamic Bayesian Network | |
| Yu, J. S.; Shi, Y. Y.; Tang, D. Y.; Liu, H. | |
| 2018 | |
| 会议名称 | 2018 IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL ENGINEERING AND ENGINEERING MANAGEMENT (IEEE IEEM) |
| 会议日期 | 2018-01-01 |
| 关键词 | Degradation modeling dynamic Bayesian network multi-field coupling particle filtering performance monitoring |
| 页码 | 1693-1698 |
| 收录类别 | CPCI-S |
| URL标识 | 查看原文 |
| WOS记录号 | WOS:000458674600338 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/5925303 |
| 专题 | 北京航空航天大学 |
| 推荐引用方式 GB/T 7714 | Yu, J. S.,Shi, Y. Y.,Tang, D. Y.,et al. Degradation Modeling and Performance Monitoring of Electro-optical Detection System via Dynamic Bayesian Network[C]. 见:2018 IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL ENGINEERING AND ENGINEERING MANAGEMENT (IEEE IEEM). 2018-01-01. |
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