Accelerated Degradation Testing Optimal Design Based on Uncertain Process | |
Guo, Zuo-Chen; Li, Xiao-Yang; Chen, Wen-Bin | |
2018 | |
会议名称 | 12TH INTERNATIONAL CONFERENCE ON RELIABILITY, MAINTAINABILITY, AND SAFETY (ICRMS 2018) |
会议日期 | 2018-01-01 |
关键词 | Accelerated degradation testing (ADT) Optimal design Uncertain process Least square method |
页码 | 249-253 |
收录类别 | EI ; CPCI-S |
URL标识 | 查看原文 |
WOS记录号 | WOS:000474741700044 |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/5923767 |
专题 | 北京航空航天大学 |
推荐引用方式 GB/T 7714 | Guo, Zuo-Chen,Li, Xiao-Yang,Chen, Wen-Bin. Accelerated Degradation Testing Optimal Design Based on Uncertain Process[C]. 见:12TH INTERNATIONAL CONFERENCE ON RELIABILITY, MAINTAINABILITY, AND SAFETY (ICRMS 2018). 2018-01-01. |
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