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	Intelligent tuning method of PID parameters based on iterative learning control for atomic force microscopy
	Liu, Hui; Li, Yingzi; Zhang, Yingxu; Chen, Yifu; Song, Zihang; Wang, Zhenyu; Zhang, Suoxin; Qian, Jianqiang
刊名	MICRON
	2018
卷号	104页码:26-36
关键词	Intelligent tuning method PID parameters Iterative learning control Atomic force microscopy
ISSN号	0968-4328
DOI	10.1016/j.micron.2017.09.009
URL标识	查看原文
收录类别	SCIE ; EI ; PUBMED
WOS记录号	WOS:000418984200004
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5923226
专题	北京航空航天大学
推荐引用方式 GB/T 7714	Liu, Hui,Li, Yingzi,Zhang, Yingxu,et al. Intelligent tuning method of PID parameters based on iterative learning control for atomic force microscopy[J]. MICRON,2018,104:26-36.
APA	Liu, Hui.,Li, Yingzi.,Zhang, Yingxu.,Chen, Yifu.,Song, Zihang.,...&Qian, Jianqiang.(2018).Intelligent tuning method of PID parameters based on iterative learning control for atomic force microscopy.MICRON,104,26-36.
MLA	Liu, Hui,et al."Intelligent tuning method of PID parameters based on iterative learning control for atomic force microscopy".MICRON 104(2018):26-36.

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