QQ客服 官方微博 反馈留言

	Improved-Sensitivity Resonant Electric-Field Probes Based on Planar Spiral Stripline and Rectangular Plate Structure
	Wang, Jianwei; Yan, Zhaowen; Liu, Wei; Yan, Xin; Fan, Jun
刊名	IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
	2019
卷号	68页码:882-894
关键词	Electric-field probe electromagnetic interference (EMI) high sensitivity near-field measurements resonant
ISSN号	0018-9456
DOI	10.1109/TIM.2018.2857898
URL标识	查看原文
收录类别	SCIE ; EI
WOS记录号	WOS:000458762100025
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5922997
专题	北京航空航天大学
推荐引用方式 GB/T 7714	Wang, Jianwei,Yan, Zhaowen,Liu, Wei,et al. Improved-Sensitivity Resonant Electric-Field Probes Based on Planar Spiral Stripline and Rectangular Plate Structure[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,2019,68:882-894.
APA	Wang, Jianwei,Yan, Zhaowen,Liu, Wei,Yan, Xin,&Fan, Jun.(2019).Improved-Sensitivity Resonant Electric-Field Probes Based on Planar Spiral Stripline and Rectangular Plate Structure.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,68,882-894.
MLA	Wang, Jianwei,et al."Improved-Sensitivity Resonant Electric-Field Probes Based on Planar Spiral Stripline and Rectangular Plate Structure".IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 68(2019):882-894.

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。