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	Standing-wave spectrometry in silicon nano-waveguides using reflection-based near-field scanning optical microscopy
	Sun, Yi-Zhi; Ding, Wei; Wang, Bin-Bin; Salas-Montiel, Rafael; Blaize, Sylvain; Bachelot, Renaud; Fan, Zhong-Wei; Feng, Li-Shuang
刊名	CHINESE PHYSICS B
	2019
卷号	28
关键词	near-field scanning optical microscopes integrated optics interferometry
ISSN号	1674-1056
DOI	10.1088/1674-1056/28/1/010702
URL标识	查看原文
收录类别	SCIE ; EI
WOS记录号	WOS:000456867200002
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5922007
专题	北京航空航天大学
推荐引用方式 GB/T 7714	Sun, Yi-Zhi,Ding, Wei,Wang, Bin-Bin,et al. Standing-wave spectrometry in silicon nano-waveguides using reflection-based near-field scanning optical microscopy[J]. CHINESE PHYSICS B,2019,28.
APA	Sun, Yi-Zhi.,Ding, Wei.,Wang, Bin-Bin.,Salas-Montiel, Rafael.,Blaize, Sylvain.,...&Feng, Li-Shuang.(2019).Standing-wave spectrometry in silicon nano-waveguides using reflection-based near-field scanning optical microscopy.CHINESE PHYSICS B,28.
MLA	Sun, Yi-Zhi,et al."Standing-wave spectrometry in silicon nano-waveguides using reflection-based near-field scanning optical microscopy".CHINESE PHYSICS B 28(2019).

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