CORC  > 北京航空航天大学
Shaping SiC MOSFET Voltage and Current Transitions by Intelligent Control for Reduced EMI Generation
Xu, Congwen; Ma, Qishuang; Xu, Ping; Cui, Tongkai
刊名ELECTRONICS
2019
卷号8
关键词power converters EMI intelligent control classical gate driver interference sources
ISSN号2079-9292
DOI10.3390/electronics8050508
URL标识查看原文
收录类别SCIE
WOS记录号WOS:000470999900039
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/5919026
专题北京航空航天大学
推荐引用方式
GB/T 7714
Xu, Congwen,Ma, Qishuang,Xu, Ping,et al. Shaping SiC MOSFET Voltage and Current Transitions by Intelligent Control for Reduced EMI Generation[J]. ELECTRONICS,2019,8.
APA Xu, Congwen,Ma, Qishuang,Xu, Ping,&Cui, Tongkai.(2019).Shaping SiC MOSFET Voltage and Current Transitions by Intelligent Control for Reduced EMI Generation.ELECTRONICS,8.
MLA Xu, Congwen,et al."Shaping SiC MOSFET Voltage and Current Transitions by Intelligent Control for Reduced EMI Generation".ELECTRONICS 8(2019).
个性服务
查看访问统计
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。


©版权所有 ©2017 CSpace - Powered by CSpace