Absolute measurement of roughness and lateral-correlation length of random surfaces by use of the simplified model of image-speckle contrast | |
Cheng, CF[1]; Liu, CX[2]; Zhang, NY[3]; Jia, TQ; Li, RX; Xu, ZZ | |
2002 | |
卷号 | 41期号:20页码:4148-4156 |
URL标识 | 查看原文 |
WOS记录号 | WOS:000176672100012 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/5777247 |
专题 | 山东师范大学 |
作者单位 | 1.[1]Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai 201800, Peoples R China 2.[2]Shandong Normal Univ, Shandong 250014, Peoples R China 3.[3]Shandong Inst Architecture, Shandong 250014, Peoples R China 4.[4]物理与电子科学学院 |
推荐引用方式 GB/T 7714 | Cheng, CF[1],Liu, CX[2],Zhang, NY[3],et al. Absolute measurement of roughness and lateral-correlation length of random surfaces by use of the simplified model of image-speckle contrast[J],2002,41(20):4148-4156. |
APA | Cheng, CF[1],Liu, CX[2],Zhang, NY[3],Jia, TQ,Li, RX,&Xu, ZZ.(2002).Absolute measurement of roughness and lateral-correlation length of random surfaces by use of the simplified model of image-speckle contrast.,41(20),4148-4156. |
MLA | Cheng, CF[1],et al."Absolute measurement of roughness and lateral-correlation length of random surfaces by use of the simplified model of image-speckle contrast".41.20(2002):4148-4156. |
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