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	Absolute measurement of roughness and lateral-correlation length of random surfaces by use of the simplified model of image-speckle contrast
	Cheng, CF[1]; Liu, CX[2]; Zhang, NY[3]; Jia, TQ; Li, RX; Xu, ZZ
	2002
卷号	41期号:20页码:4148-4156
URL标识	查看原文
WOS记录号	WOS:000176672100012
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5777247
专题	山东师范大学
作者单位	1.[1]Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai 201800, Peoples R China 2.[2]Shandong Normal Univ, Shandong 250014, Peoples R China 3.[3]Shandong Inst Architecture, Shandong 250014, Peoples R China 4.[4]物理与电子科学学院
推荐引用方式 GB/T 7714	Cheng, CF[1],Liu, CX[2],Zhang, NY[3],et al. Absolute measurement of roughness and lateral-correlation length of random surfaces by use of the simplified model of image-speckle contrast[J],2002,41(20):4148-4156.
APA	Cheng, CF[1],Liu, CX[2],Zhang, NY[3],Jia, TQ,Li, RX,&Xu, ZZ.(2002).Absolute measurement of roughness and lateral-correlation length of random surfaces by use of the simplified model of image-speckle contrast.,41(20),4148-4156.
MLA	Cheng, CF[1],et al."Absolute measurement of roughness and lateral-correlation length of random surfaces by use of the simplified model of image-speckle contrast".41.20(2002):4148-4156.

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