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	Orthogonal analysis for perovskite structure microwave dielectric ceramic thin films fabricated by the RF magnetron-sputtering methodSCI被引量：SCI原文链接
	Cui Chuanwen[1,2]; Shi Feng[1,2]; Li Yuguo[1]; Wang Shuyun[1]
	2010
卷号	21期号:4页码:349-354
URL标识	查看原文
WOS记录号	WOS:000275461600006
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5777129
专题	山东师范大学
作者单位	1.[1]Shandong Normal Univ, Coll Phys & Elect, Jinan 250014, Shandong, Peoples R China 2.[2]Shandong Univ, State Key Lab Crystal Mat, Jinan 250100, Peoples R China
推荐引用方式 GB/T 7714	Cui Chuanwen[1,2],Shi Feng[1,2],Li Yuguo[1],等. Orthogonal analysis for perovskite structure microwave dielectric ceramic thin films fabricated by the RF magnetron-sputtering methodSCI被引量：SCI原文链接[J],2010,21(4):349-354.
APA	Cui Chuanwen[1,2],Shi Feng[1,2],Li Yuguo[1],&Wang Shuyun[1].(2010).Orthogonal analysis for perovskite structure microwave dielectric ceramic thin films fabricated by the RF magnetron-sputtering methodSCI被引量：SCI原文链接.,21(4),349-354.
MLA	Cui Chuanwen[1,2],et al."Orthogonal analysis for perovskite structure microwave dielectric ceramic thin films fabricated by the RF magnetron-sputtering methodSCI被引量：SCI原文链接".21.4(2010):349-354.

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