Orthogonal analysis for perovskite structure microwave dielectric ceramic thin films fabricated by the RF magnetron-sputtering methodSCI被引量:SCI原文链接 | |
Cui Chuanwen[1,2]; Shi Feng[1,2]; Li Yuguo[1]; Wang Shuyun[1] | |
2010 | |
卷号 | 21期号:4页码:349-354 |
URL标识 | 查看原文 |
WOS记录号 | WOS:000275461600006 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/5777129 |
专题 | 山东师范大学 |
作者单位 | 1.[1]Shandong Normal Univ, Coll Phys & Elect, Jinan 250014, Shandong, Peoples R China 2.[2]Shandong Univ, State Key Lab Crystal Mat, Jinan 250100, Peoples R China |
推荐引用方式 GB/T 7714 | Cui Chuanwen[1,2],Shi Feng[1,2],Li Yuguo[1],等. Orthogonal analysis for perovskite structure microwave dielectric ceramic thin films fabricated by the RF magnetron-sputtering methodSCI被引量:SCI原文链接[J],2010,21(4):349-354. |
APA | Cui Chuanwen[1,2],Shi Feng[1,2],Li Yuguo[1],&Wang Shuyun[1].(2010).Orthogonal analysis for perovskite structure microwave dielectric ceramic thin films fabricated by the RF magnetron-sputtering methodSCI被引量:SCI原文链接.,21(4),349-354. |
MLA | Cui Chuanwen[1,2],et al."Orthogonal analysis for perovskite structure microwave dielectric ceramic thin films fabricated by the RF magnetron-sputtering methodSCI被引量:SCI原文链接".21.4(2010):349-354. |
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