QQ客服 官方微博 反馈留言

	Total-ionizing-dose effects in pixel performance degradation of CMOS image sensors under low dose rate
	Xu, Shou-Long; Zou, Shu-Liang
刊名	International Conference on Nuclear Engineering, Proceedings, ICONE
	2015
卷号	2015-January
关键词	CMOS image sensors Radiation damage Total ionizing dose effects
会议名称	23rd International Conference on Nuclear Engineering: Nuclear Power - Reliable Global Energy, ICONE 2015
URL标识	查看原文
会议地点	Chiba, Japan
会议日期	May 17, 2015 - May 21, 2015
WOS记录号	EI:20160902019333
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5689182
专题	南华大学
作者单位	1.[Xu, Shou-Long 2.Zou, Shu-Liang] University of South China, HengYang, HuNan, China
推荐引用方式 GB/T 7714	Xu, Shou-Long,Zou, Shu-Liang. Total-ionizing-dose effects in pixel performance degradation of CMOS image sensors under low dose rate[J]. International Conference on Nuclear Engineering, Proceedings, ICONE,2015,2015-January.
APA	Xu, Shou-Long,&Zou, Shu-Liang.(2015).Total-ionizing-dose effects in pixel performance degradation of CMOS image sensors under low dose rate.International Conference on Nuclear Engineering, Proceedings, ICONE,2015-January.
MLA	Xu, Shou-Long,et al."Total-ionizing-dose effects in pixel performance degradation of CMOS image sensors under low dose rate".International Conference on Nuclear Engineering, Proceedings, ICONE 2015-January(2015).

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。