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	In situ Matrix Removal Studies and Determination of Trace Mn, Cr, and Cu in High Purity Tantalum Pentaoxide by Electrothermal Vaporization-Inductively Coupled Plasma Mass Spectrometry
	Chen, Shizhong*; Zhu, Shengping; Lu, Dengbo
刊名	Atomic Spectroscopy
	2014
卷号	35期号:3页码:103-108
ISSN号	0195-5373
URL标识	查看原文
WOS记录号	WOS:000338915600002
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5578336
专题	武汉轻工大学
作者单位	1.[Chen, Shizhong 2.Zhu, Shengping 3.Lu, Dengbo] Wuhan Polytech Univ, Coll Chem & Environm Engn, Wuhan 430023, Peoples R China.
推荐引用方式 GB/T 7714	Chen, Shizhong*,Zhu, Shengping,Lu, Dengbo. In situ Matrix Removal Studies and Determination of Trace Mn, Cr, and Cu in High Purity Tantalum Pentaoxide by Electrothermal Vaporization-Inductively Coupled Plasma Mass Spectrometry[J]. Atomic Spectroscopy,2014,35(3):103-108.
APA	Chen, Shizhong*,Zhu, Shengping,&Lu, Dengbo.(2014).In situ Matrix Removal Studies and Determination of Trace Mn, Cr, and Cu in High Purity Tantalum Pentaoxide by Electrothermal Vaporization-Inductively Coupled Plasma Mass Spectrometry.Atomic Spectroscopy,35(3),103-108.
MLA	Chen, Shizhong*,et al."In situ Matrix Removal Studies and Determination of Trace Mn, Cr, and Cu in High Purity Tantalum Pentaoxide by Electrothermal Vaporization-Inductively Coupled Plasma Mass Spectrometry".Atomic Spectroscopy 35.3(2014):103-108.

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