In situ Matrix Removal Studies and Determination of Trace Mn, Cr, and Cu in High Purity Tantalum Pentaoxide by Electrothermal Vaporization-Inductively Coupled Plasma Mass Spectrometry | |
Chen, Shizhong*; Zhu, Shengping; Lu, Dengbo | |
刊名 | Atomic Spectroscopy
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2014 | |
卷号 | 35期号:3页码:103-108 |
ISSN号 | 0195-5373 |
URL标识 | 查看原文 |
WOS记录号 | WOS:000338915600002 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/5578336 |
专题 | 武汉轻工大学 |
作者单位 | 1.[Chen, Shizhong 2.Zhu, Shengping 3.Lu, Dengbo] Wuhan Polytech Univ, Coll Chem & Environm Engn, Wuhan 430023, Peoples R China. |
推荐引用方式 GB/T 7714 | Chen, Shizhong*,Zhu, Shengping,Lu, Dengbo. In situ Matrix Removal Studies and Determination of Trace Mn, Cr, and Cu in High Purity Tantalum Pentaoxide by Electrothermal Vaporization-Inductively Coupled Plasma Mass Spectrometry[J]. Atomic Spectroscopy,2014,35(3):103-108. |
APA | Chen, Shizhong*,Zhu, Shengping,&Lu, Dengbo.(2014).In situ Matrix Removal Studies and Determination of Trace Mn, Cr, and Cu in High Purity Tantalum Pentaoxide by Electrothermal Vaporization-Inductively Coupled Plasma Mass Spectrometry.Atomic Spectroscopy,35(3),103-108. |
MLA | Chen, Shizhong*,et al."In situ Matrix Removal Studies and Determination of Trace Mn, Cr, and Cu in High Purity Tantalum Pentaoxide by Electrothermal Vaporization-Inductively Coupled Plasma Mass Spectrometry".Atomic Spectroscopy 35.3(2014):103-108. |
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