Determination of Trace Rare Earth Impurities in Tantalum Pentaoxide by Electrothermal Vaporization ICP-MS Using in situ Volatilization for Matrix Removal | |
Chen, Shizhong*; Zhu, Shengping; Lu, Dengbo | |
刊名 | Atomic Spectroscopy
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2013 | |
卷号 | 34期号:1页码:1-5 |
ISSN号 | 0195-5373 |
URL标识 | 查看原文 |
WOS记录号 | WOS:000316510200001 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/5577613 |
专题 | 武汉轻工大学 |
作者单位 | 1.[Chen, Shizhong 2.Lu, Dengbo] Wuhan Polytech Univ, Coll Chem & Environm Engn, Wuhan 430023, Peoples R China. |
推荐引用方式 GB/T 7714 | Chen, Shizhong*,Zhu, Shengping,Lu, Dengbo. Determination of Trace Rare Earth Impurities in Tantalum Pentaoxide by Electrothermal Vaporization ICP-MS Using in situ Volatilization for Matrix Removal[J]. Atomic Spectroscopy,2013,34(1):1-5. |
APA | Chen, Shizhong*,Zhu, Shengping,&Lu, Dengbo.(2013).Determination of Trace Rare Earth Impurities in Tantalum Pentaoxide by Electrothermal Vaporization ICP-MS Using in situ Volatilization for Matrix Removal.Atomic Spectroscopy,34(1),1-5. |
MLA | Chen, Shizhong*,et al."Determination of Trace Rare Earth Impurities in Tantalum Pentaoxide by Electrothermal Vaporization ICP-MS Using in situ Volatilization for Matrix Removal".Atomic Spectroscopy 34.1(2013):1-5. |
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