QQ客服 官方微博 反馈留言

	Determination of Trace Rare Earth Impurities in Tantalum Pentaoxide by Electrothermal Vaporization ICP-MS Using in situ Volatilization for Matrix Removal
	Chen, Shizhong*; Zhu, Shengping; Lu, Dengbo
刊名	Atomic Spectroscopy
	2013
卷号	34期号:1页码:1-5
ISSN号	0195-5373
URL标识	查看原文
WOS记录号	WOS:000316510200001
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5577613
专题	武汉轻工大学
作者单位	1.[Chen, Shizhong 2.Lu, Dengbo] Wuhan Polytech Univ, Coll Chem & Environm Engn, Wuhan 430023, Peoples R China.
推荐引用方式 GB/T 7714	Chen, Shizhong*,Zhu, Shengping,Lu, Dengbo. Determination of Trace Rare Earth Impurities in Tantalum Pentaoxide by Electrothermal Vaporization ICP-MS Using in situ Volatilization for Matrix Removal[J]. Atomic Spectroscopy,2013,34(1):1-5.
APA	Chen, Shizhong*,Zhu, Shengping,&Lu, Dengbo.(2013).Determination of Trace Rare Earth Impurities in Tantalum Pentaoxide by Electrothermal Vaporization ICP-MS Using in situ Volatilization for Matrix Removal.Atomic Spectroscopy,34(1),1-5.
MLA	Chen, Shizhong*,et al."Determination of Trace Rare Earth Impurities in Tantalum Pentaoxide by Electrothermal Vaporization ICP-MS Using in situ Volatilization for Matrix Removal".Atomic Spectroscopy 34.1(2013):1-5.

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。