Orthogonal analysis for perovskite structure microwave dielectric ceramic thin films fabricated by the RF magnetron-sputtering method | |
Cui Chuanwen; Shi Feng; Li Yuguo; Wang Shuyun | |
刊名 | JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
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2010 | |
卷号 | 21期号:4页码:349-354 |
DOI | 10.1007/s10854-009-9919-y |
URL标识 | 查看原文 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/5510690 |
专题 | 山东大学 |
作者单位 | 1.Shandong Normal Univ, Coll Phys & Elect, Jinan 250014, Shandong, Peoples R China. 2.[Cui Chuanwen 3.Sh |
推荐引用方式 GB/T 7714 | Cui Chuanwen,Shi Feng,Li Yuguo,et al. Orthogonal analysis for perovskite structure microwave dielectric ceramic thin films fabricated by the RF magnetron-sputtering method[J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,2010,21(4):349-354. |
APA | Cui Chuanwen,Shi Feng,Li Yuguo,&Wang Shuyun.(2010).Orthogonal analysis for perovskite structure microwave dielectric ceramic thin films fabricated by the RF magnetron-sputtering method.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,21(4),349-354. |
MLA | Cui Chuanwen,et al."Orthogonal analysis for perovskite structure microwave dielectric ceramic thin films fabricated by the RF magnetron-sputtering method".JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 21.4(2010):349-354. |
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