Intrinsic stability of an HBT based on a small signal equivalent circuit model | |
Yanhu, Chen; Huajun, Shen; Xinyu, Liu; Huijun, Li; Hui, Xu; Ling, Li | |
刊名 | Journal of Semiconductors
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2010 | |
卷号 | 31期号:12 |
关键词 | HBT intrinsic stability small signal equivalent circuit model stability factor |
DOI | 10.1088/1674-4926/31/12/124010 |
URL标识 | 查看原文 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/5498607 |
专题 | 山东大学 |
作者单位 | 1.School of Information Science and Engineering, Shandong University, Jinan 250100, China 2.[Huajun, Shen 3.X |
推荐引用方式 GB/T 7714 | Yanhu, Chen,Huajun, Shen,Xinyu, Liu,et al. Intrinsic stability of an HBT based on a small signal equivalent circuit model[J]. Journal of Semiconductors,2010,31(12). |
APA | Yanhu, Chen,Huajun, Shen,Xinyu, Liu,Huijun, Li,Hui, Xu,&Ling, Li.(2010).Intrinsic stability of an HBT based on a small signal equivalent circuit model.Journal of Semiconductors,31(12). |
MLA | Yanhu, Chen,et al."Intrinsic stability of an HBT based on a small signal equivalent circuit model".Journal of Semiconductors 31.12(2010). |
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