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	Intrinsic stability of an HBT based on a small signal equivalent circuit model
	Yanhu, Chen; Huajun, Shen; Xinyu, Liu; Huijun, Li; Hui, Xu; Ling, Li
刊名	Journal of Semiconductors
	2010
卷号	31期号:12
关键词	HBT intrinsic stability small signal equivalent circuit model stability factor
DOI	10.1088/1674-4926/31/12/124010
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5498607
专题	山东大学
作者单位	1.School of Information Science and Engineering, Shandong University, Jinan 250100, China 2.[Huajun, Shen 3.X
推荐引用方式 GB/T 7714	Yanhu, Chen,Huajun, Shen,Xinyu, Liu,et al. Intrinsic stability of an HBT based on a small signal equivalent circuit model[J]. Journal of Semiconductors,2010,31(12).
APA	Yanhu, Chen,Huajun, Shen,Xinyu, Liu,Huijun, Li,Hui, Xu,&Ling, Li.(2010).Intrinsic stability of an HBT based on a small signal equivalent circuit model.Journal of Semiconductors,31(12).
MLA	Yanhu, Chen,et al."Intrinsic stability of an HBT based on a small signal equivalent circuit model".Journal of Semiconductors 31.12(2010).

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