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A Test Sequence Generation Method Based on Dependencies and Slices
Jin-peng MO; Jun-yi LI; Jian-wen HUANG
会议名称2017 2nd International Conference on Advances in Management Engineering and Information Technology(AMEIT 2017)
会议日期2017
会议地点中国上海
会议录Proceedings of 2017 2nd International Conference on Advances in Management Engineering and Information Technology(AMEIT 2017)
URL标识查看原文
内容类型会议论文
URI标识http://www.corc.org.cn/handle/1471x/5472401
专题湖南大学
作者单位College of Computer Science and Electronic Engineering,Hunan University
推荐引用方式
GB/T 7714
Jin-peng MO,Jun-yi LI,Jian-wen HUANG. A Test Sequence Generation Method Based on Dependencies and Slices[C]. 见:2017 2nd International Conference on Advances in Management Engineering and Information Technology(AMEIT 2017). 中国上海. 2017.
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