| A critical analysis of the bulk current injection immunity test based on common-mode and differential-mode | |
| Tan, Ligang; Li, Ziwen; Xiang, Yunxiu; Feng, Pengfei; Guo, Yage | |
| 刊名 | Microelectronics Reliability
 |
| 2018 | |
| 卷号 | Vol.91页码:188-193 |
| URL标识 | 查看原文 |
| 公开日期 | [db:dc_date_available] |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/5470549 |
| 专题 | 湖南大学 |
| 作者单位 | 1.State Key Laboratory of Advanced Design and Manufacturing for Vehicle Body, College of Mechanical and Vehicle Engineering, Hunan University, Changsha 2.410082, China 3.Pan Asia Technical Automotive Center Co. Ltd., Shanghai 4.201201, China |
| 推荐引用方式 GB/T 7714 | Tan, Ligang,Li, Ziwen,Xiang, Yunxiu,et al. A critical analysis of the bulk current injection immunity test based on common-mode and differential-mode[J]. Microelectronics Reliability,2018,Vol.91:188-193. |
| APA | Tan, Ligang,Li, Ziwen,Xiang, Yunxiu,Feng, Pengfei,&Guo, Yage.(2018).A critical analysis of the bulk current injection immunity test based on common-mode and differential-mode.Microelectronics Reliability,Vol.91,188-193. |
| MLA | Tan, Ligang,et al."A critical analysis of the bulk current injection immunity test based on common-mode and differential-mode".Microelectronics Reliability Vol.91(2018):188-193. |
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