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	Survey of key technologies on millimeter-wave CMOS integrated circuits
	Fei Yu; Lei Gao; Lixiang Li; Shuo Cai; Wei Wang and Chunhua Wang
刊名	IOP Conference Series: Materials Science and Engineering
	2018
卷号	Vol.351 No.1页码:012011
ISSN号	1757-8981;1757-899x
URL标识	查看原文
公开日期	[db:dc_date_available]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5467132
专题	湖南大学
作者单位	1.Hunan Provincial Key Laboratory of Intelligent Processing of Big Data on Transportation & School of Computer and Communication Engineering, Changsha University of Science and Technology, Changsha 410114, China 2.College of Information Science and Engineering, Hunan University, Changsha, 410082, China
推荐引用方式 GB/T 7714	Fei Yu,Lei Gao,Lixiang Li,et al. Survey of key technologies on millimeter-wave CMOS integrated circuits[J]. IOP Conference Series: Materials Science and Engineering,2018,Vol.351 No.1:012011.
APA	Fei Yu,Lei Gao,Lixiang Li,Shuo Cai,&Wei Wang and Chunhua Wang.(2018).Survey of key technologies on millimeter-wave CMOS integrated circuits.IOP Conference Series: Materials Science and Engineering,Vol.351 No.1,012011.
MLA	Fei Yu,et al."Survey of key technologies on millimeter-wave CMOS integrated circuits".IOP Conference Series: Materials Science and Engineering Vol.351 No.1(2018):012011.

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