Survey of key technologies on millimeter-wave CMOS integrated circuits | |
Fei Yu; Lei Gao; Lixiang Li; Shuo Cai; Wei Wang and Chunhua Wang | |
刊名 | IOP Conference Series: Materials Science and Engineering
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2018 | |
卷号 | Vol.351 No.1页码:012011 |
ISSN号 | 1757-8981;1757-899x |
URL标识 | 查看原文 |
公开日期 | [db:dc_date_available] |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/5467132 |
专题 | 湖南大学 |
作者单位 | 1.Hunan Provincial Key Laboratory of Intelligent Processing of Big Data on Transportation & School of Computer and Communication Engineering, Changsha University of Science and Technology, Changsha 410114, China 2.College of Information Science and Engineering, Hunan University, Changsha, 410082, China |
推荐引用方式 GB/T 7714 | Fei Yu,Lei Gao,Lixiang Li,et al. Survey of key technologies on millimeter-wave CMOS integrated circuits[J]. IOP Conference Series: Materials Science and Engineering,2018,Vol.351 No.1:012011. |
APA | Fei Yu,Lei Gao,Lixiang Li,Shuo Cai,&Wei Wang and Chunhua Wang.(2018).Survey of key technologies on millimeter-wave CMOS integrated circuits.IOP Conference Series: Materials Science and Engineering,Vol.351 No.1,012011. |
MLA | Fei Yu,et al."Survey of key technologies on millimeter-wave CMOS integrated circuits".IOP Conference Series: Materials Science and Engineering Vol.351 No.1(2018):012011. |
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